Unprecedented productivity for volume 200mm wafer manufacturing

For chipmakers that want to maximize their investment in 200mm test equipment, accurate and reliable high-volume probing is more important than ever. The 4090µ+ is designed to meet these demands while reducing test costs through increased throughput, simplified operation and state-of-the-art automation.

4090µ+ Key Benefits:

• The ability to address the testing demands associated with fine-pitch devices, copper interconnects, low-k dielectrics and other advanced applications.
• Reduced pad damage with MicroTouch.
• Decreased test costs by increasing test cell availability and throughput.
• Simplified, efficient operation through "one-button" probing and self-calibration features.
• Increased probe card alignment speed and accuracy by utilizing advanced vision system and probe camera optics.

The 4090µ+ is also available as an upgrade to 4080, 4090, and 4090µ probers to extend the advanced applications of your 200mm tools and maximize your investment.