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SORTware: Higher Level Management Tools
- Map Level Bin Monitor (MLBM)
- Statistical Process Control
- Allows process experts to implement process rules
- Triggers built-in messaging to notify process owner when rule is violated.
- Reduces test processed-induced yield loss
- Reduces retest throughput loss due to retest
- Raises confidence in first pass test results
Statistical Bin Monitoring |
Test Pass Correlation Analysis |
- Overall Equipment Effectiveness (OEE)
- Quickly detect and correct problems that impact productivity and profitability with real-time test floor status viewer
- Semi E10 reports & graphs
- Records and measure test floor equipment reliability and availability
- Optimizes processes, throughput and utilization
Overall Equipment Effectiveness
- Process Step Verification (PSV)
- Ensures Wafers / Lots will not be tested or processed until they have completed the previous step in the process
- Designed to be flexible such that it can be adapted to accommodate virtually
- Based on the use of maps at each process step
- Maps are generated at the first test or visual inspection step
- Subsequent process steps utilize the updated result map to process only good die
- If a process step is missed the equipment and process owner are notified
- Subsequent process step will not follow or process a map that does not have the correct information
- Map Editor
- Die, map, and lot-level viewing & editing capabilities
- Easily integrated with other TFMS applications
Map Viewer
and Editor
- EG Desktop
- Desktop analysis station
- Complete, robust SPC & graphical reporting engine
- Scripting language for easy custom report generation
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